Nanodiamond nanofluid microstructural and thermo-electrical characterization
International Communications in Heat and Mass Transfer, 101: 82-88(2019)
Making Diamond Work Where Nothing Else Can
Headquartered in Nashville, Tennessee and operating since 2012, FemtoSci specializes in developing diamond-based technologies that make operating in extreme environments possible. We work with government agencies like DOD, DOE, and NASA, and develop technologies for industry, the energy sector, and defense.
International Communications in Heat and Mass Transfer, 101: 82-88(2019)
IEEE ITherm Conference, The Cosmopolitan of Las Vegas, Las Vegas, NV USA(2019)
International Journal of Heat and Mass Transfer, 129: 1123-1135(2019)
ASME's International Mechanical Engineering Congress and Exposition, Pittsburgh PA, USA(2018)
New Diamond and Nano Carbons Conference (NDNC), Flagstaff, Arizona, USA(2018)
3rd Thermal and Fluids Engineering Conference (TFEC), Fort Lauderdale, FL, USA(2018)
Heat Transfer Engineering(2018)
ASME's International Mechanical Engineering Congress and Exposition, Pittsburgh PA, USA(2018)
Micro and Nano Flows 2018, Atlanta, GA(2018)
Fraley et. al.
HITECH 2014, Los Angeles, CA(2014)
Y. M. Wong, W. P. Kang, J. L. Davidson, D. V. Kerns and J. H. Huang
J. Vac. Sci. Technol. B, 25 (2): 627-630(2007)
W. P. Kang, Y. M. Wong, J. L. Davidson, D. V. Kerns, B. K. Choi, J. H. Huang and K. F. Galloway
IEE Electronics Letters, 42(4): 210-211(2006)
Y. M. Wong, W. P. Kang, J. L. Davidson, B. K. Choi, D. V. Kerns, and J. H. Huang
Technical Digest of IVNC 2006, Guilin, China(2006)
K. Subramanian, W.P. Kang, J.L. Davidson, R.S. Takalkar, B.K. Choi, M. Howell, and D.V. Kerns
Diamond and Related Materials, 15: 1126-1133(2006)
S. Sayil, D. Kerns and S. Kerns
IEEE Transactions On Instrumentation and Measurement(5)(2005)
R. S. Takalkar, J. L. Davidson, W. P. Kang, A. Wisitsora-at, and D. V. Kerns
Journal of Vacuum Science and Technology B, 23(2): 800-804(2005)
Y. Gurbuz, W. P. Kang, J. L. Davidson, D. V. Kerns, and Q. Zhou
IEEE Transactions on Power Electronics, 20(1): 1-10(2005)